Single RF Probe

MEMS

Application side: wafer level measurement, millimeter wave measurement

Inquiry

Cantiliver

Application side: PCB measurement, FPC measurement, Package IC measurement, Optical transceiver IC measurement

  • Highly customized for any probe pitch and probe length
  • Suitable for any DUT, strong tip structure
  • GSG: 26GHz, 40GHz, 50GHz, 67GHz
  • GS/SG: 26GHz, 40GHz,  50GHz, 67GHz
Inquiry

Dual / Differential RF Probe

MEMS

Application side: wafer level measurement, millimeter wave measurement

Inquiry

Cantiliver

Application side: PCB measurement, FPC measurement, Package IC measurement, Optical transceiver IC measurement

  • GSSG: 26GHz, 40GHz, 50GHz, 67GHz
  • GSGSG: 26GHz, 40GHz, 50GHz, 67GHz
  • Customized Connector: Angle, Vertical
Inquiry

Adjustable Dual RF Probe

  • Adjust between GS/SG, GSG/GSG, or S/S up to 4,000um
  • Easy handling, micrometer structure. (Patented)
  • Low Insertion Loss and Return Loss up to 67GHz.
  • Air Coplanar probe (require uniformed pitch and configuration) , OR Custom Fabrication RF Cantilever probe. (cannot be mixed air coplanar probe)
  • Adjustable Dual RF Probe Reference Spec: PDF
Inquiry

Waveguide

Application side: WR5~WR15 measurement

  • Low insertion loss and return loss.
  • Air coplanar design.
  • Small Probe Mark
  • Wide range of pitch selection.
  • Probe Tip Replacement service available. (Limited times replacement)
Inquiry

Multi Contact Probe

DC

  • Up to 34pin (standard) / Please ask above 34pin availability.
  • Custom Fabrication Cantilever probes.
  • Long life cycle, Durable
  • Non Initial Cost requirement.
  • 34pin DC probe spec: PDF
Inquiry

RF+DC

  • Low Insertion Loss and Return Loss up to 67GHz.
  • RF Air Coplanar probe (require uniformed pitch and configuration) , OR Custom Fabrication RF Cantilever probe available. (cannot be mixed air coplanar probe)
  • Cantilever DC Probes up to around 25pins (depend on pitch requirement)
  • Uniformed Pitch and configuration: 40GHz 50GHz 67GHz 
Inquiry

Calibration Substrate

Single/Dual

  • Accurate resistance value control (+/- 0.003%)
  • SOLT / TRL calibration available
  • Support for GSG/ GS&SG / GSGSG / GSSG(50ohm) probe
Inquiry

Cutomized Design

  • Accurate resistance value control (+/- 0.003%)
  • SOLT / TRL calibration available
  • Support for customized probe & probe card
Inquiry

Probe Card

Application side: wafer level mass production measurement

  • Low Insertion Loss and Return Loss up to 67GHz.
  • RF Air Coplanar probe (require uniformed pitch and configuration) , OR Custom Fabrication RF Cantilever probe available. (cannot be mixed air coplanar probe and RF cantilever)
  • Cantilever DC Probes up to around 25pins (depend on pitch requirement)
  • Long Life Cycle (typical over 2M contact in Auto probe mode/Cantilever type)
  • De-Embed File Available
  • Typical Spec: 10GHz 40GHz 67GHz
Inquiry
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