Probe Station
Double-sided probe station
/ Features
- Test object platform dimensions: 750 mm x 700 mm, with sliding capability and clamp-type securing
- Front measurement range: 20 mm inward from all four edges
- Rear measurement range: 50 mm inward from all four edges
- Available in DC and RF versions, with probe access from all four directions (north, south, east, west)
- Probe station dimensions: W x D x H 3200 mm x 1600 mm x 2000 mm
/ Configuration
- This model features a probe station equipped with casters and fixed support legs
- Standard configuration includes a 2 μm precision fine-adjustment stagev
- Equipped with a sliding-axis microscope, HDMI video output, and a high-brightness adjustable LED light source
Probe
Staion
Double-Side Probe Station
/ Features
- Test object platform dimensions: 750 mm x 700 mm, with sliding capability and clamp-type securing
- Front measurement range: 20 mm inward from all four edges
- Rear measurement range: 50 mm inward from all four edges
- Available in DC and RF versions, with probe access from all four directions (north, south, east, west)
- Probe station dimensions: W x D x H 3200 mm x 1600 mm x 2000 mm
/ Configurations
- This model features a probe station equipped with casters and fixed support legs
- Standard configuration includes a 2 μm precision fine-adjustment stage
- Equipped with a sliding-axis microscope, HDMI video output, and a high-brightness adjustable LED light source
Wafer-level probe station
Suitable for chips, wafers, R&D validation, pre-packaging testing, etc.
Double-sided probe station
Suitable for double-sided chips and wafers; can also be used for R&D validation and pre-packaging testing
Modular Probe Station
Highly customizable,
flexible and scalable semiconductor test equipment