Probe Station
Microscope System
Designed for use on a probe station, it provides the field of view required for probe insertion.
/ Features
New-generation electron microscope with 4K resolution, high magnification, and extended working distance
Compatible with a microscope fine-adjustment stage for adjustable axial control
Supports rear probe insertion and is compatible with 90-degree angled microscopes
Lighting options include annular illumination and coaxial illumination
Probe
Staion
Microscope System
Designed for use on a probe station, it provides the field of view required for probe insertion.
/ Features
New-generation electron microscope with 4K resolution, high magnification, and extended working distance
Compatible with a microscope fine-adjustment stage for adjustable axial control
Supports rear probe insertion and is compatible with 90-degree angled microscopes
Lighting options include annular illumination and coaxial illumination
Wafer-level probe station
Suitable for chips, wafers, R&D validation, pre-packaging testing, etc.
Double-sided probe station
Suitable for double-sided chips and wafers; can also be used for R&D validation and pre-packaging testing
Modular Probe Station
Highly customizable,
flexible and scalable semiconductor test equipment