Probe Station
Modular Probe Station
/ Features
Modular design, compatible with a wide range of accessories
Customizable test object platform, with interchangeable chucks and fixtures
Built-in anti-vibration system
/ Configuration
Stainless steel base with aluminum alloy design
Slider compatible with both manual and pneumatic operation; can be locked or released
Standard configuration includes a pair of fine-adjustment stands with magnetic bases
Microscope magnification: 40X–230X / 55X–300X, 150 mm working distance (optional)
Probe
Staion
Modular Probe Station
/ Features
Modular design, compatible with a wide range of accessories
Customizable test object platform, with interchangeable chucks and fixtures
Built-in anti-vibration system
/ Configuration
Stainless steel base with aluminum alloy design
Slider compatible with both manual and pneumatic operation; can be locked or released
Standard configuration includes a pair of fine-adjustment stands with magnetic bases
Microscope magnification: 40X–230X / 55X–300X, 150 mm working distance (optional)
Wafer-level probe station
Suitable for chips, wafers, R&D validation, pre-packaging testing, etc.
Double-sided probe station
Suitable for double-sided chips and wafers; can also be used for R&D validation and pre-packaging testing
Modular Probe Station
Highly customizable,
flexible and scalable semiconductor test equipment