Probe Station
Wafer-level probe station
/ Features
- Chuck supports multi-mode movement
- High-precision, high-speed movement platform
- Supports multiple wafer sizes
- Suitable for use on a desktop, vibration-isolation platform, or in a darkroom
- Available in DC and RF versions
/ Configuration
- Stainless steel base with aluminum alloy design
- Standard configuration includes a pair of fine-adjustment stands with magnetic bases
- Microscope equipped with X- and Y-axis movement brackets, supporting coaxial illumination
- Microscope magnification: 40X–220X / 55X–300X, 150 mm working distance (optional)
Probe
Staion
Wafer-level probe station
/ Features
- Chuck supports multi-mode movement
- High-precision, high-speed movement platform
- Supports multiple wafer sizes
- Suitable for use on a desktop, vibration-isolation platform, or in a darkroom
- Available in DC and RF versions
/ Configuration
- Stainless steel base with aluminum alloy design
- Standard configuration includes a pair of fine-adjustment stands with magnetic bases
- Microscope equipped with X- and Y-axis movement brackets, supporting coaxial illumination
- Microscope magnification: 40X–220X / 55X–300X, 150 mm working distance (optional)
Wafer-level probe station
Suitable for chips, wafers, R&D validation, pre-packaging testing, etc.
Double-sided probe station
Suitable for double-sided chips and wafers; can also be used for R&D validation and pre-packaging testing
Modular Probe Station
Highly customizable,
flexible and scalable semiconductor test equipment