產品與服務

射頻元件

探針台

MMICs

Package & Final Test

技術支援

SYSTEM TOPOLOGY

Rack & Stack System Provide Modification to Meet Customer Requirement

Technical Support

Final Testing

system topology-1 1

SYSTEM TOPOLOGY

Rack & Stack system provide modification
to meet customer requirement

TRAY Type

Support JEDEC/EIAJ Tray or Customize Tray

Frame 521

TRAY Type

Support JEDEC/EIAJ Tray or Customize Tray

OUTPUT DATA FORMAT

Output_Date_Form
  • FT Test Raw Data Format could be Csv and Excel
  • Column Bin Define the Good and Bad Die

OUTPUT DATA FORMAT

Output_Date_Form
  • FT Test Raw Data Format could be Csv and Excel
  • Column Bin Define the Good and Bad Die